|
Volumn 73, Issue 10, 2001, Pages 2153-2156
|
Scanning optical microscopy with an electrogenerated chemiluminescent light source at a nanometer tip
a a a a a |
Author keywords
[No Author keywords available]
|
Indexed keywords
SHEAR FORCE;
ELECTRODES;
LIGHT SOURCES;
OPTICAL MICROSCOPY;
SCANNING;
CHEMILUMINESCENCE;
PROPYLAMINE;
RUTHENIUM;
AQUEOUS SOLUTION;
ARTICLE;
CHEMOLUMINESCENCE;
COMPARATIVE STUDY;
CYCLIC POTENTIOMETRY;
ELECTROCHEMICAL ANALYSIS;
ELECTRODE;
OPTICAL RESOLUTION;
PH;
SCANNING ELECTRON MICROSCOPY;
SHEAR STRESS;
|
EID: 0035872369
PISSN: 00032700
EISSN: None
Source Type: Journal
DOI: 10.1021/ac001538q Document Type: Article |
Times cited : (91)
|
References (18)
|