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Physica Status Solidi (A) Applied Research

Volumn 192, Issue 1, 2002, Pages 72-78

Comparative study of the electronic band structure of strained C-plane and M-plane GaN films by polarized photoreflectance spectroscopy

(6) Ghosh, S a Waltereit, P a Thamm, A a Brandt, O a Grahn, H T a Ploog, K H a

a PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC STRUCTURE; ENERGY GAP; HAMILTONIANS; LIGHT POLARIZATION; SILICON CARBIDE; SPECTROSCOPIC ANALYSIS; SPECTRUM ANALYSIS;

POLARIZED PHOTOREFLECTANCE SPECTROSCOPY;

GALLIUM NITRIDE;

EID: 0036650496 PISSN: 00318965 EISSN: None Source Type: Journal
DOI: 10.1002/1521-396X(200207)192:1<72::AID-PSSA72>3.0.CO;2-A Document Type: Conference Paper

Times cited : (2)

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