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Volumn 180, Issue 1, 2000, Pages 73-79

Morphology of GaN surfaces and GaN/(Al, Ga)N interfaces grown on 6H-SiC(0001) by reactive molecular beam epitaxy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; INTERFACES (MATERIALS); MOLECULAR BEAM EPITAXY; MORPHOLOGY; OPTICAL PROPERTIES; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SEMICONDUCTOR GROWTH; SEMICONDUCTOR QUANTUM WELLS; SILICON CARBIDE; SURFACE ROUGHNESS; SURFACES; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0034229278     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(200007)180:1<73::AID-PSSA73>3.0.CO;2-B     Document Type: Article
Times cited : (9)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.