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Volumn 242, Issue 3-4, 2002, Pages 302-308
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Influence of Bi impurity as a surfactant during the growth of GaN by metalorganic vapor phase epitaxy
a a a a a |
Author keywords
A3. Metalorganic vapor phase epitaxy; B1. Nitrides; B2. Semiconducting III V materials
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
BISMUTH;
CRYSTAL DEFECTS;
CRYSTAL IMPURITIES;
GALLIUM NITRIDE;
HOLE TRAPS;
LOW TEMPERATURE EFFECTS;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
NITRIDES;
PHOTOLUMINESCENCE;
SURFACE ACTIVE AGENTS;
SURFACE ROUGHNESS;
GAS-PHASE CONCENTRATIONS;
CRYSTAL GROWTH;
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EID: 0036645162
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(02)01419-7 Document Type: Article |
Times cited : (18)
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References (21)
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