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Volumn 41, Issue 6 B, 2002, Pages 4105-4110

Fine pattern replication using ETS-1 three-aspherical mirror imaging system

Author keywords

DRAM; EUVL; Lithography; Mask; Resist; Synchrotron radiation

Indexed keywords

ASPHERICS; CHROMIUM; DYNAMIC RANDOM ACCESS STORAGE; LIGHT REFLECTION; MASKS; MIRRORS; MULTILAYERS; PHOTORESISTS; SYNCHROTRONS; ULTRAVIOLET RADIATION;

EID: 0036614618     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.41.4105     Document Type: Article
Times cited : (21)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.