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Volumn 41, Issue 6 B, 2002, Pages 4287-4290
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Ultra-smooth surface preparation using gas cluster ion beams
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Author keywords
Cluster ion; Lateral sputtering; Scratch removal; Surface smoothing
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Indexed keywords
ARGON;
ATOMS;
CHEMICAL MECHANICAL POLISHING;
ION BEAMS;
ION BOMBARDMENT;
NANOSTRUCTURED MATERIALS;
SPUTTER DEPOSITION;
TARGETS;
GAS CLUSTER ION BEAMS (GCIB) PROCESSING;
SURFACE TREATMENT;
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EID: 0036614420
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.41.4287 Document Type: Article |
Times cited : (21)
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References (16)
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