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Volumn 24, Issue 1-2, 2002, Pages 229-234
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Microscopic mechanism of thermal silicon oxide growth
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Author keywords
Growth rate; Initial enhanced oxidation; Interstitials; Oxidation; Silicon; Theory
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Indexed keywords
COMPUTER SIMULATION;
CONTINUUM MECHANICS;
INTERFACES (MATERIALS);
OXIDATION;
STRAIN;
THIN FILMS;
INITIAL ENHANCED OXIDATION;
SILICA;
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EID: 0036577657
PISSN: 09270256
EISSN: None
Source Type: Journal
DOI: 10.1016/S0927-0256(02)00199-4 Document Type: Conference Paper |
Times cited : (32)
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References (29)
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