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Volumn 20, Issue 2, 2002, Pages 413-423
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Particle formation during low-pressure chemical vapor deposition from silane and oxygen: Measurement, modeling, and film properties
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
CORRELATION METHODS;
CURRENT VOLTAGE CHARACTERISTICS;
MATHEMATICAL MODELS;
MORPHOLOGY;
NUCLEATION;
OXYGEN;
PARTICLE SIZE ANALYSIS;
PERMITTIVITY;
SILANES;
TRANSMISSION ELECTRON MICROSCOPY;
LOW-PRESSURE CHEMICAL VAPOR DEPOSITION (LPCVD);
THIN FILMS;
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EID: 0036495191
PISSN: 07342101
EISSN: None
Source Type: Journal
DOI: 10.1116/1.1448506 Document Type: Article |
Times cited : (17)
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References (46)
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