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Volumn 19, Issue 2, 2002, Pages 24-33
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I DDQ testing for deep-submicron ICs: Challenges and solutions
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Author keywords
[No Author keywords available]
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Indexed keywords
DRAIN INDUCED BARRIER LOWERING;
GATE INDUCED DRAIN LEAKAGE;
HOT CARRIER INJECTION;
QUIESCENT POWER SUPPLY CURRENT;
VECTOR CONTROL TECHNIQUE;
CARRIER MOBILITY;
CMOS INTEGRATED CIRCUITS;
ELECTRIC POWER SUPPLIES TO APPARATUS;
ELECTRON TUNNELING;
GATES (TRANSISTOR);
HOT CARRIERS;
LEAKAGE CURRENTS;
LOGIC GATES;
MOSFET DEVICES;
THRESHOLD VOLTAGE;
VECTORS;
INTEGRATED CIRCUIT TESTING;
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EID: 0036494796
PISSN: 07407475
EISSN: None
Source Type: Journal
DOI: 10.1109/54.990439 Document Type: Article |
Times cited : (28)
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References (15)
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