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Volumn 19, Issue 2, 2002, Pages 24-33

I DDQ testing for deep-submicron ICs: Challenges and solutions

Author keywords

[No Author keywords available]

Indexed keywords

DRAIN INDUCED BARRIER LOWERING; GATE INDUCED DRAIN LEAKAGE; HOT CARRIER INJECTION; QUIESCENT POWER SUPPLY CURRENT; VECTOR CONTROL TECHNIQUE;

EID: 0036494796     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/54.990439     Document Type: Article
Times cited : (28)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.