Current ratios: a self-scaling technique for production IDDQ testing

IEEE International Test Conference (TC)

Volumn , Issue , 2000, Pages 1148-1156

  Maxwell, Peter ^a   O'Neill, Pete ^a   Aitken, Rob ^a   Dudley, Roland ^a   Jaarsma, Neal ^a   Quach, Minh ^a   Wiseman, Don ^a  

^a HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHIP BACKGROUND CURRENTS; CURRENT RATIO; CURRENT SIGNATURES; DYNAMIC THRESHOLDS;

CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENTS; INTEGRATED CIRCUIT LAYOUT; LEAKAGE CURRENTS; THRESHOLD VOLTAGE;

INTEGRATED CIRCUIT TESTING;

EID: 0034484427     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)