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Volumn 30, Issue 1 III, 2002, Pages 442-449

Direct current bias effects in RF induction thermal plasma diamond CVD

Author keywords

Chemical vapor deposition; Diamond film; Electron emission; RF thermal plasma; Substrate bias

Indexed keywords

DIRECT CURRENT BIAS;

EID: 0036478260     PISSN: 00933813     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPS.2002.1003894     Document Type: Article
Times cited : (11)

References (35)
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    • Chen, Q.1    Lin, Z.2
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    • The use of Langmuir probes in the study of high pressure plasmas
    • (1976) Adv. Phys. , vol.25 , Issue.5 , pp. 517-553
    • Smy, P.R.1
  • 34


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.