Analysis of white light interferograms using wavelet methods

Optics Communications

Volumn 148, Issue 1-3, 1998, Pages 122-128

  Recknagel, Rolf Jürgen ^a   Notni, Gunther ^a  

^a FRAUNHOFER INSTITUTE FOR APPLIED OPTICS AND PRECISION ENGINEERING   (Germany)

Author keywords

Surface profile measurement; Wavelet transform; White light interferometry

Indexed keywords

COMPUTER SIMULATION; WAVELET TRANSFORMS;

SURFACE PROFILE MEASUREMENT; WHITE LIGHT INTERFEROGRAMS;

INTERFEROMETERS;

EID: 0032028084     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(97)00644-5     Document Type: Article

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