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Volumn 16, Issue 1, 1998, Pages 59-68

Generating ∼90 nanometer features using near-field contact-mode photolithography with an elastomeric phase mask

Author keywords

[No Author keywords available]

Indexed keywords


EID: 11644312704     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589836     Document Type: Article
Times cited : (118)

References (16)
  • 3
    • 0003071293 scopus 로고
    • 10th Annual Symposium on Microlithography
    • K. H. Toh, G. Dao, R. Singh, and H. Gaw, SPIE 1496, 10th Annual Symposium on Microlithography, 1990, pp. 27-53.
    • (1990) SPIE , vol.1496 , pp. 27-53
    • Toh, K.H.1    Dao, G.2    Singh, R.3    Gaw, H.4
  • 8
    • 0004084481 scopus 로고
    • Wiley, New York
    • M. V. Klein, Optics (Wiley, New York, 1970).
    • (1970) Optics
    • Klein, M.V.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.