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Volumn 16, Issue 1, 1998, Pages 59-68
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Generating ∼90 nanometer features using near-field contact-mode photolithography with an elastomeric phase mask
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 11644312704
PISSN: 10711023
EISSN: None
Source Type: Journal
DOI: 10.1116/1.589836 Document Type: Article |
Times cited : (118)
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References (16)
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