-
1
-
-
0003053090
-
-
Vancouver, Canada
-
R. Lai, M. Barsky, R. Grundbacher, L. Tran, T. Block, T.P. Chin, V. Medvedev, E. Sabin, H. Rogers, P.H. Liu, Y.C. Chen, R. Tsai and D. Streit: Proceedings of International Conference on Gallium-Arsenide Manufacturing Technology, Vancouver, Canada, 1999, p. 249.
-
(1999)
Proceedings of International Conference on Gallium-Arsenide Manufacturing Technology
, pp. 249
-
-
Lai, R.1
Barsky, M.2
Grundbacher, R.3
Tran, L.4
Block, T.5
Chin, T.P.6
Medvedev, V.7
Sabin, E.8
Rogers, H.9
Liu, P.H.10
Chen, Y.C.11
Tsai, R.12
Streit, D.13
-
3
-
-
0032638316
-
-
M. Nishimoto, M. Sholley, H. Wang, R. Lai, M. Barsky, D.C. Streit, et al.,: Technical Digest of IEEE Radio Frequency Integrated Circuits (RFIC) Symposium, 1999, p.99.
-
(1999)
Technical Digest of IEEE Radio Frequency Integrated Circuits (RFIC) Symposium
, pp. 99
-
-
Nishimoto, M.1
Sholley, M.2
Wang, H.3
Lai, R.4
Barsky, M.5
Streit, D.C.6
-
4
-
-
0030678240
-
-
R. Lai, H. Wang, Y.C. Chen, T. Block, P.H. Liu, D.C. Streit, D. Tran, P. Siegel, M. Barsky, W. Jones, and T. Gaier: Proceedings of International Conference InP and Related Materials, 1997, p.241.
-
(1997)
Proceedings of International Conference InP and Related Materials
, pp. 241
-
-
Lai, R.1
Wang, H.2
Chen, Y.C.3
Block, T.4
Liu, P.H.5
Streit, D.C.6
Tran, D.7
Siegel, P.8
Barsky, M.9
Jones, W.10
Gaier, T.11
-
5
-
-
0033710472
-
-
R. Raja, M. Nishimoto, M. Barsky, M. Sholley, B. Osgood, R. Quon, G. Barber, P. Liu, P. Chin, and R. Lai: Technical Digest of IEEE International MTT Symposium, 2000, p.987.
-
(2000)
Technical Digest of IEEE International MTT Symposium
, pp. 987
-
-
Raja, R.1
Nishimoto, M.2
Barsky, M.3
Sholley, M.4
Osgood, B.5
Quon, R.6
Barber, G.7
Liu, P.8
Chin, P.9
Lai, R.10
-
6
-
-
17644447790
-
-
San Francisco, USA
-
R. Lai, M. Barsky, R. Grundbacher, P.H. Liu, T.P. Chin, M. Nishimoto, et al.,: Technical Digest of IEEE International Electron Device Meeting, San Francisco, USA, 2000, p.175.
-
(2000)
Technical Digest of IEEE International Electron Device Meeting
, pp. 175
-
-
Lai, R.1
Barsky, M.2
Grundbacher, R.3
Liu, P.H.4
Chin, T.P.5
Nishimoto, M.6
-
7
-
-
0032637356
-
-
Davos, Switzerland
-
M. Barsky, R. Lai, Y.L. Kok, M. Sholley, D.C. Streit, T. Block, P.H. Liu, E. Sabin, H. Rogers, V. Medvedev, T. Gaier, and L. Samsoka: Proceedings of International Conference InP and Related Materials, Davos, Switzerland, 1999, p.423.
-
(1999)
Proceedings of International Conference InP and Related Materials
, pp. 423
-
-
Barsky, M.1
Lai, R.2
Kok, Y.L.3
Sholley, M.4
Streit, D.C.5
Block, T.6
Liu, P.H.7
Sabin, E.8
Rogers, H.9
Medvedev, V.10
Gaier, T.11
Samsoka, L.12
-
9
-
-
0034840736
-
-
Nara, Japan
-
Y.C. Chou, D. Leung, J. Scarpulla, R. Lai, M. Barsky, R. Grundbacher, M. Nishimoto, P.H. Liu, and D.C. Streit: Proceedings of International Conference of InP and Related Materials, Nara, Japan, 2001, p.618.
-
(2001)
Proceedings of International Conference of InP and Related Materials
, pp. 618
-
-
Chou, Y.C.1
Leung, D.2
Scarpulla, J.3
Lai, R.4
Barsky, M.5
Grundbacher, R.6
Nishimoto, M.7
Liu, P.H.8
Streit, D.C.9
-
10
-
-
0002206111
-
-
Las Vegas, Nevada, USA
-
M.J. Delaney, R.C. Wong, T.T. Lee, and B.M. Paine: Proceedings of International Conference on Gallium-Arsenide Manufacturing Technology, Las Vegas, Nevada, USA, 2001, p. 89.
-
(2001)
Proceedings of International Conference on Gallium-Arsenide Manufacturing Technology
, pp. 89
-
-
Delaney, M.J.1
Wong, R.C.2
Lee, T.T.3
Paine, B.M.4
-
11
-
-
0011784535
-
-
Y.C. Chou, D. Leung, R. Lai, R. Grundbacher, J. Scarpulla, M. Barsky, M. Nishimoto, D. Eng, P.H. Liu, A. Oki, and D. Streit, Jpn. J. Appl. Phys., Vol. 41, 2002, p. 109.
-
(2002)
Jpn. J. Appl. Phys.
, vol.41
, pp. 109
-
-
Chou, Y.C.1
Leung, D.2
Lai, R.3
Grundbacher, R.4
Scarpulla, J.5
Barsky, M.6
Nishimoto, M.7
Eng, D.8
Liu, P.H.9
Oki, A.10
Streit, D.11
-
12
-
-
0001444578
-
-
Vancouver, Canada
-
E. Sabin, V. Medevedev, H. Rogers, and R. Elmadjian: Proceedings of International Conference on Gallium-Arsenide Manufacturing Technology, Vancouver, Canada, 1999, p. 39.
-
(1999)
Proceedings of International Conference on Gallium-Arsenide Manufacturing Technology
, pp. 39
-
-
Sabin, E.1
Medevedev, V.2
Rogers, H.3
Elmadjian, R.4
-
13
-
-
0011791765
-
-
Y.C. Chou, D. Leung, R. Lai, R. Grundbacher, M. Barsky, R. Elmadjian, S. Olson, D. Eng, P.H. Liu, and A. Oki, Technical Digest of GOMAC Conference, 2002, p. 190.
-
(2002)
Technical Digest of GOMAC Conference
, pp. 190
-
-
Chou, Y.C.1
Leung, D.2
Lai, R.3
Grundbacher, R.4
Barsky, M.5
Elmadjian, R.6
Olson, S.7
Eng, D.8
Liu, P.H.9
Oki, A.10
-
14
-
-
0036085284
-
-
Y.C. Chou, D. Leung, R. Lai, R. Grundbacher, D. Eng, J. Scarpulla, M. Barsky, P.H. Liu, M. Biedenbender, A. Oki, and D. Streit, Proceedings of International Reliability Physics and Symposium, 2002, p. 241.
-
(2002)
Proceedings of International Reliability Physics and Symposium
, pp. 241
-
-
Chou, Y.C.1
Leung, D.2
Lai, R.3
Grundbacher, R.4
Eng, D.5
Scarpulla, J.6
Barsky, M.7
Liu, P.H.8
Biedenbender, M.9
Oki, A.10
Streit, D.11
-
15
-
-
0033678290
-
-
Y.C. Chen, M. Barsky, R. Tsai, R. Lai, H.C. Yen, A. Oki, and D.C. Streit, the Technical Digest of IEEE MTT-Symposium, 2000, p.1917.
-
(2000)
The Technical Digest of IEEE MTT-Symposium
, pp. 1917
-
-
Chen, Y.C.1
Barsky, M.2
Tsai, R.3
Lai, R.4
Yen, H.C.5
Oki, A.6
Streit, D.C.7
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