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Volumn 3, Issue , 2000, Pages 1917-1920

Survivability of InP HEMT devices and MMIC's under high RF input drive

Author keywords

[No Author keywords available]

Indexed keywords

INDIUM PHOSPHIDE HIGH ELECTRON MOBILITY TRANSISTOR DEVICE; MONOLITHIC MICROWAVE INTEGRATED CIRCUIT AMPLIFIERS;

EID: 0033678290     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article
Times cited : (8)

References (5)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.