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Volumn 3, Issue , 2000, Pages 1917-1920
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Survivability of InP HEMT devices and MMIC's under high RF input drive
a a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
INDIUM PHOSPHIDE HIGH ELECTRON MOBILITY TRANSISTOR DEVICE;
MONOLITHIC MICROWAVE INTEGRATED CIRCUIT AMPLIFIERS;
CAPACITORS;
COMPUTER SIMULATION;
ELECTRIC BREAKDOWN;
IMPEDANCE MATCHING (ELECTRIC);
MICROSTRIP LINES;
MICROWAVE AMPLIFIERS;
MONOLITHIC MICROWAVE INTEGRATED CIRCUITS;
RESISTORS;
SEMICONDUCTING INDIUM PHOSPHIDE;
HIGH ELECTRON MOBILITY TRANSISTORS;
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EID: 0033678290
PISSN: 0149645X
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Article |
Times cited : (8)
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References (5)
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