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Volumn 250, Issue 1, 2002, Pages 104-107
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Study of surface forces dependence on pH by atomic force microscopy
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Author keywords
Adhesion forces; Atomic force microscopy; Electrokinetic measurements; Electrostatic forces; Zeta potential
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ELECTROLYTES;
ELECTROSTATICS;
PH EFFECTS;
SILICON CARBIDE;
SILICON NITRIDE;
SODIUM CHLORIDE;
ZETA POTENTIAL THEORY;
SURFACE CHEMISTRY;
COPPER;
ELECTROLYTE;
NICKEL;
SILICON CARBIDE;
SILICON NITRIDE;
SODIUM CHLORIDE;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CALCULATION;
CHEMICAL INTERACTION;
FORCE;
ISOELECTRIC POINT;
MEASUREMENT;
PH;
PRIORITY JOURNAL;
ZETA POTENTIAL;
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EID: 0036352754
PISSN: 00219797
EISSN: None
Source Type: Journal
DOI: 10.1006/jcis.2002.8327 Document Type: Article |
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Times cited : (17)
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References (18)
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