A study of adhesion forces by atomic force microscopy

Journal of Adhesion Science and Technology

Volumn 15, Issue 6, 2001, Pages 681-687

  Jacquot, C ^a   Takadoum, J ^a  

^a Centre National de la Recherche Scientifique   (France)

Author keywords

Adhesion force; AFM; Electron acceptor parameter; Electron donor parameter; Surface energy

Indexed keywords

ATOMIC FORCE MICROSCOPY; INTERFACIAL ENERGY; LIQUIDS; SILICON NITRIDE; SURFACE MEASUREMENT; SURFACE TENSION; AMIDES; ETHANOL; ETHYLENE GLYCOL; SILICON; SURFACE CHEMISTRY;

ADHESION FORCES; ELECTRON ACCEPTOR PARAMETER; ELECTRON DONOR PARAMETER; VAN OSS-CHAUDHURY-GOOD MODEL;

ADHESION;

ADHESION FORCES; AFM; ELECTRON DONORS; ELECTRON-ACCEPTOR; SURFACE ENERGIES;

EID: 0034924436     PISSN: 01694243     EISSN: None     Source Type: Journal    
DOI: 10.1163/156856101750430422     Document Type: Article

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