Measurement of interaction forces between silica and α-alumina by atomic force microscopy

Journal of Colloid and Interface Science

Volumn 184, Issue 2, 1996, Pages 594-600

  Veeramasuneni, S ^a   Yalamanchili, M R ^a,b   Miller, J D ^a  

^a UNIVERSITY OF UTAH   (United States)

^b MEMC Electronic Materials Inc   (United States)

Author keywords

aggregation; alumina; atomic force microscopy; dispersion; electrostatic forces; point of zero charge; silica

Indexed keywords

ALUMINUM OXIDE; SILICON DIOXIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTROSTATIC PRECIPITATION; PH; PRIORITY JOURNAL;

EID: 0030602292     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1006/jcis.1996.0656     Document Type: Article

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