Adhesion forces measured by atomic force microscopy in humid air

Analytical Chemistry

Volumn 72, Issue 10, 2000, Pages 2183-2189

  Sedin, Dana L ^a   Rowlen, Kathy L ^a  

^a UNIVERSITY OF COLORADO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; AMBIENT AIR; ARTICLE; ATOMIC FORCE MICROSCOPY; CONTACT ANGLE; HUMIDITY; MATHEMATICAL ANALYSIS; MATHEMATICAL MODEL; SURFACE PROPERTY;

EID: 0034658375     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac991198c     Document Type: Article

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