SCOPUS 정보 검색 플랫폼

Ultramicroscopy

Volumn 92, Issue 3-4, 2002, Pages 221-232

Combined microscope for scanning X-ray transmission and surface topography

(4) Browne, M T a Charalambous, P a Burge, R E a,b Yuan, X C c

a KING'S COLLEGE LONDON (United Kingdom)

b UNIVERSITY OF CAMBRIDGE (United Kingdom)

c NANYANG TECHNOLOGICAL UNIVERSITY (Singapore)

Author keywords

Image formation; Surface topography; X ray microscopy; Zone plates

Indexed keywords

ATOMIC FORCE MICROSCOPY; CORROSION; IMAGING TECHNIQUES; OPTICAL RESOLVING POWER; PHOTONS; RADIATION DAMAGE; SYNCHROTRON RADIATION; X RAY OPTICS;

SCANNING TRANSMISSION X-RAY MICROSCOPES (STXM);

SURFACE TOPOGRAPHY;

CARBON;

ARTICLE; ATOMIC FORCE MICROSCOPY; CONTROLLED STUDY; CORROSION; ELECTRIC CONDUCTIVITY; ENERGY; GEOMETRY; IMAGE PROCESSING; MICROSCOPE; MICROSCOPY; PHOTON; RADIATION INJURY; ROENTGEN MICROSCOPY; SAMPLE; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SURFACE PROPERTY; SURFACE TOPOGRAPHY; SYNCHROTRON RADIATION; TECHNIQUE; TOPOGRAPHY; X RAY;

EID: 0036288960 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-3991(02)00138-9 Document Type: Article

Times cited : (3)

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