Novel scanning near-field optical microscopy/atomic force microscope probes by combined micromachining and electron-beam nanolithography

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 17, Issue 5, 1999, Pages 1954-1958

  Zhou, H ^a   Midha, A ^a   Bruchhaus, L ^a   Mills, G ^a   Donaldson, L ^a   Weaver, J M R ^a  

^a UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 22844455985     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.590855     Document Type: Article

References (5)

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