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Journal of the Electrochemical Society

Volumn 149, Issue 1, 2002, Pages

Initial oxidation processes on hydrogenated silicon surfaces studied by in situ Raman spectroscopy

(5) Liu, Feng Ming a Ren, Bin a Yan, Jia Wei a Mao, Bing Wei a,b Tian, Zhong Qun a,b

a XIAMEN UNIVERSITY (China)

b XIAMEN UNIVERSITY (China)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; HYDROGENATION; OXIDATION; PH EFFECTS; RAMAN SPECTROSCOPY; SILICON COMPOUNDS;

SILICON SURFACES;

ELECTROLYTES;

EID: 0036226178 PISSN: 00134651 EISSN: None Source Type: Journal
DOI: 10.1149/1.1426400 Document Type: Article

Times cited : (21)

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