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Ultramicroscopy

Volumn 90, Issue 4, 2002, Pages 291-300

Determination of absolute configurations of crystal structures using electron diffraction patterns by means of least-squares refinement

(2) Jansen, J a Zandbergen, H W a

a DELFT UNIVERSITY OF TECHNOLOGY (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DATA STRUCTURES; ELECTRON DIFFRACTION; ELECTRON SCATTERING; X RAY CRYSTALLOGRAPHY;

FRIEDEL REFLECTIONS;

CRYSTAL STRUCTURE;

CERIUM; COPPER; PHOSPHORUS;

ACCURACY; ARTICLE; CRYSTAL STRUCTURE; ELECTRON; ELECTRON DIFFRACTION; REGRESSION ANALYSIS; X RAY; X RAY CRYSTALLOGRAPHY;

EID: 0036185955 PISSN: 03043991 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-3991(01)00136-X Document Type: Article

Times cited : (12)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.