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Volumn 40, Issue 11, 2002, Pages 6547-6551

Increase of dielectric constant of an epitaxial (100) yttria-stabilized zirconia film on (100) Si substrate deposited by reactive sputtering in the metallic mode

Author keywords

Dielectric constant; Heteroepitaxial growth; Metallic mode; Reactive sputtering; Si; Silicon; YSZ

Indexed keywords

ANNEALING; CAPACITANCE; ELECTRIC POTENTIAL; FILM PREPARATION; LEAKAGE CURRENTS; MAGNETRON SPUTTERING; PERMITTIVITY; ZIRCONIA;

EID: 0036152928     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.40.6547     Document Type: Article
Times cited : (3)

References (25)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.