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Volumn 40, Issue 11, 2002, Pages 6547-6551
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Increase of dielectric constant of an epitaxial (100) yttria-stabilized zirconia film on (100) Si substrate deposited by reactive sputtering in the metallic mode
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Author keywords
Dielectric constant; Heteroepitaxial growth; Metallic mode; Reactive sputtering; Si; Silicon; YSZ
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Indexed keywords
ANNEALING;
CAPACITANCE;
ELECTRIC POTENTIAL;
FILM PREPARATION;
LEAKAGE CURRENTS;
MAGNETRON SPUTTERING;
PERMITTIVITY;
ZIRCONIA;
HETEROEPITAXIAL GROWTH;
METALLIC MODE;
YTTRIA;
YTTRIUM COMPOUNDS;
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EID: 0036152928
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.40.6547 Document Type: Article |
Times cited : (3)
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References (25)
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