-
1
-
-
4143150811
-
Lithography with 157 nm lasers
-
T.M. Bloomstein, M.W. Horn, M. Rothschild, R.R. Kunz, S.T. Palmacci, and R.B. Goodman, "Lithography with 157 nm lasers", J. Vac. Sci. Technol., B15, 2112 (1997).
-
(1997)
J. Vac. Sci. Technol.
, vol.B15
, pp. 2112
-
-
Bloomstein, T.M.1
Horn, M.W.2
Rothschild, M.3
Kunz, R.R.4
Palmacci, S.T.5
Goodman, R.B.6
-
2
-
-
0032675485
-
Outlook for 157 nm resist design
-
R.R. Kunz, T.M. Bloomstein, D.E. Hardy, R.B. Goodman, D.K. Downs, and J.E. Curtin, "Outlook for 157 nm resist design", Proc. SPIE Vol.3678, 13 (1999).
-
(1999)
Proc. SPIE
, vol.3678
, pp. 13
-
-
Kunz, R.R.1
Bloomstein, T.M.2
Hardy, D.E.3
Goodman, R.B.4
Downs, D.K.5
Curtin, J.E.6
-
3
-
-
0034768329
-
Effect of fluorinated monomer unit introduction to KrF resin system in F2 lithography
-
Y. Uetani, K. Hashimoto, Y. Miya, I. Yoshida, M. Takigawa and R. Hanawa, "Effect of fluorinated monomer unit introduction to KrF resin system in F2 lithography", Proc. SPIE Vol. 4345, 379 (2001).
-
(2001)
Proc. SPIE
, vol.4345
, pp. 379
-
-
Uetani, Y.1
Hashimoto, K.2
Miya, Y.3
Yoshida, I.4
Takigawa, M.5
Hanawa, R.6
-
4
-
-
0033708240
-
Prospects for using existing resists for evaluating 157 nm imaging systems
-
T.H. Fedynyshyn, R.R. Kunz, S.O. Doran, R.B. Goodman, M.L. Lind, and J.E. Curtin, "Prospects for using existing resists for evaluating 157 nm imaging systems", Proc. SPIE Vol. 3999, 335 (2000).
-
(2000)
Proc. SPIE
, vol.3999
, pp. 335
-
-
Fedynyshyn, T.H.1
Kunz, R.R.2
Doran, S.O.3
Goodman, R.B.4
Lind, M.L.5
Curtin, J.E.6
-
5
-
-
0034315298
-
Vacuum ultraviolet spectra of fluorocompounds for 157 nm lithography
-
M. Toriumi, I. Satoh and T. Itani, "Vacuum ultraviolet spectra of fluorocompounds for 157 nm lithography", J. Vac. Sci. Technol. B18, 3328 (2000).
-
(2000)
J. Vac. Sci. Technol.
, vol.B18
, pp. 3328
-
-
Toriumi, M.1
Satoh, I.2
Itani, T.3
-
6
-
-
0035519174
-
Characterization of fluoropolymers for 157 nm chemically amplified resist
-
T. Itani, M. Toriumi, T. Naito, S. Ishikawa, S. Miyoshi, T. Yamazaki and M. Watanabe, "Characterization of fluoropolymers for 157 nm chemically amplified resist.", J. Vac. Sci. Technol. B19, 2705 (2001).
-
(2001)
J. Vac. Sci. Technol.
, vol.B19
, pp. 2705
-
-
Itani, T.1
Toriumi, M.2
Naito, T.3
Ishikawa, S.4
Miyoshi, S.5
Yamazaki, T.6
Watanabe, M.7
-
7
-
-
0035747030
-
Resist property of fluoropolymer for 157 nm lithography
-
S. Ishikawa, M. Toriumi, S. Miyoshi, T. Naito, T. Yamazaki, M. Watanabe and T. Itani, "Resist property of fluoropolymer for 157 nm lithography", J. Photopolymer Sci. Technol., 14, 595 (2001).
-
(2001)
J. Photopolymer Sci. Technol.
, vol.14
, pp. 595
-
-
Ishikawa, S.1
Toriumi, M.2
Miyoshi, S.3
Naito, T.4
Yamazaki, T.5
Watanabe, M.6
Itani, T.7
-
8
-
-
0035747121
-
Rejuvenation of 248 nm resist backbones for 157 nm lithography
-
Y.-C. Bae, K. Douki, T. Yu, J. Dai, D. Schmaljohann, S.-H. Kang, K.-H. Kim, H. Koerner, W. Conley, D. Miller, R. Balasubramanian, S. Holl and C.K. Ober, "Rejuvenation of 248 nm resist backbones for 157 nm lithography", J. Photopolymer Sci. Technol., 14, 613 (2001).
-
(2001)
J. Photopolymer Sci. Technol.
, vol.14
, pp. 613
-
-
Bae, Y.-C.1
Douki, K.2
Yu, T.3
Dai, J.4
Schmaljohann, D.5
Kang, S.-H.6
Kim, K.-H.7
Koerner, H.8
Conley, W.9
Miller, D.10
Balasubramanian, R.11
Holl, S.12
Ober, C.K.13
-
9
-
-
0034768690
-
157 nm imaging using thick single layer resists
-
M.K. Crawford, A.E. Feiring, J. Feldman, R.H. French, V.A. Petrov, F.L. Schadt III, R.J. Smalley and F.C. Zumsteg, "157 nm imaging using thick single layer resists", Proc. SPIE Vol. 4345, 428 (2001).
-
(2001)
Proc. SPIE
, vol.4345
, pp. 428
-
-
Crawford, M.K.1
Feiring, A.E.2
Feldman, J.3
French, R.H.4
Petrov, V.A.5
Schadt, F.L.6
Smalley, R.J.7
Zumsteg, F.C.8
-
10
-
-
17944368287
-
Resist materials for 157 nm microlithography: An update
-
R.J. Hung, H.V. Tran, B.C. Trinque, T. Chiba, S. Yamada, D.P. Sanders, E.F. Connor, R.H. Grubbs, J. Klopp, J.M.J. Frechet, B.H. Thomas, G.J. Sharer, D.D. DesMarteau, W. Conley and G. Willson, "Resist materials for 157 nm microlithography: An update", Proc. SPIE Vol. 4345, 385 (2001).
-
(2001)
Proc. SPIE
, vol.4345
, pp. 385
-
-
Hung, R.J.1
Tran, H.V.2
Trinque, B.C.3
Chiba, T.4
Yamada, S.5
Sanders, D.P.6
Connor, E.F.7
Grubbs, R.H.8
Klopp, J.9
Frechet, J.M.J.10
Thomas, B.H.11
Sharer, G.J.12
DesMarteau, D.D.13
Conley, W.14
Willson, G.15
-
11
-
-
0035746838
-
Novel fluoropolymers for use in 157 nm lithography
-
H. Ito, G.M. Wallraff, N. Fender, P.J. Brock, C.E. Larson, H.D. Truong, G. Breyta, D.C. Miller, M.H. Sherwood, and R.D. Allen, "Novel fluoropolymers for use in 157 nm lithography", J. Photopolymer Sci. Technol., 14, 583 (2001).
-
(2001)
J. Photopolymer Sci. Technol.
, vol.14
, pp. 583
-
-
Ito, H.1
Wallraff, G.M.2
Fender, N.3
Brock, P.J.4
Larson, C.E.5
Truong, H.D.6
Breyta, G.7
Miller, D.C.8
Sherwood, M.H.9
Allen, R.D.10
-
12
-
-
0035746843
-
New resin systems for 157 nm lithography
-
R.R. Dammel, R. Sakamuri, T. Kudo, A. Romano, L. Rhodes, R. Vicari, C. Hacker, W. Conley and D. Miller, "New resin systems for 157 nm lithography", J. Photopolymer Sci. Technol., 14, 603 (2001).
-
(2001)
J. Photopolymer Sci. Technol.
, vol.14
, pp. 603
-
-
Dammel, R.R.1
Sakamuri, R.2
Kudo, T.3
Romano, A.4
Rhodes, L.5
Vicari, R.6
Hacker, C.7
Conley, W.8
Miller, D.9
-
13
-
-
0034757362
-
Theoretical calculations of photoabsorption of several alicyclic molecules in the vacuum ultraviolet region
-
N. Matsuzawa, A. Ishitani, D.A. Dixon, and T. Uda, "Theoretical calculations of photoabsorption of several alicyclic molecules in the vacuum ultraviolet region", Proc. SPIE Vol. 4345, 396 (2001).
-
(2001)
Proc. SPIE
, vol.4345
, pp. 396
-
-
Matsuzawa, N.1
Ishitani, A.2
Dixon, D.A.3
Uda, T.4
-
14
-
-
0020497931
-
Dry etch resistance of organic materials
-
H. Gokan, S. Esho and Y. Ohnishi, "Dry etch resistance of organic materials", J. Electrochem. Soc., 130, 143 (1983).
-
(1983)
J. Electrochem. Soc.
, vol.130
, pp. 143
-
-
Gokan, H.1
Esho, S.2
Ohnishi, Y.3
-
15
-
-
0029748674
-
Limits to etch resistance for 193 nm single layer resists
-
R.R. Kunz, S.C. Palmateer, A.R. Forte, R.D. Allen, G.M. Wallraff, R.A. DiPietro and D.C. Hofer, "Limits to etch resistance for 193 nm single layer resists", Proc. SPIE Vol. 2724, 365 (1996).
-
(1996)
Proc. SPIE
, vol.2724
, pp. 365
-
-
Kunz, R.R.1
Palmateer, S.C.2
Forte, A.R.3
Allen, R.D.4
Wallraff, G.M.5
DiPietro, R.A.6
Hofer, D.C.7
-
16
-
-
0000765436
-
Study of dry etching resistance of methacrylate polymers for ArF excimer laser lithography
-
T. Ohfuji, M. Endo, M. Takahashi, T. Naito, T. Tatsumi, K. Kuhara and M. Sasago, "Study of dry etching resistance of methacrylate polymers for ArF excimer laser lithography", Proc. SPIE Vol. 3333, 595 (1998).
-
(1998)
Proc. SPIE
, vol.3333
, pp. 595
-
-
Ohfuji, T.1
Endo, M.2
Takahashi, M.3
Naito, T.4
Tatsumi, T.5
Kuhara, K.6
Sasago, M.7
-
17
-
-
0005023527
-
Dry etch resistance of resist based on fluorine containing polymer
-
S. Kishimura, M. Endo and M. Sasago, "Dry etch resistance of resist based on fluorine containing polymer", Proc. Oyobutsuri Kouenkai Vol. 48, 737 (2001).
-
(2001)
Proc. Oyobutsuri Kouenkai
, vol.48
, pp. 737
-
-
Kishimura, S.1
Endo, M.2
Sasago, M.3
|