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Volumn 4690 I, Issue , 2002, Pages 486-496

The study on dry etch resistance of fluorine functionalized polymers

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL RESISTANCE; COMPOSITION EFFECTS; DRY ETCHING; FLUORINE; FUNCTIONAL POLYMERS; MATHEMATICAL MODELS;

EID: 0036029117     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.474246     Document Type: Article
Times cited : (26)

References (17)
  • 3
    • 0034768329 scopus 로고    scopus 로고
    • Effect of fluorinated monomer unit introduction to KrF resin system in F2 lithography
    • Y. Uetani, K. Hashimoto, Y. Miya, I. Yoshida, M. Takigawa and R. Hanawa, "Effect of fluorinated monomer unit introduction to KrF resin system in F2 lithography", Proc. SPIE Vol. 4345, 379 (2001).
    • (2001) Proc. SPIE , vol.4345 , pp. 379
    • Uetani, Y.1    Hashimoto, K.2    Miya, Y.3    Yoshida, I.4    Takigawa, M.5    Hanawa, R.6
  • 5
    • 0034315298 scopus 로고    scopus 로고
    • Vacuum ultraviolet spectra of fluorocompounds for 157 nm lithography
    • M. Toriumi, I. Satoh and T. Itani, "Vacuum ultraviolet spectra of fluorocompounds for 157 nm lithography", J. Vac. Sci. Technol. B18, 3328 (2000).
    • (2000) J. Vac. Sci. Technol. , vol.B18 , pp. 3328
    • Toriumi, M.1    Satoh, I.2    Itani, T.3
  • 13
    • 0034757362 scopus 로고    scopus 로고
    • Theoretical calculations of photoabsorption of several alicyclic molecules in the vacuum ultraviolet region
    • N. Matsuzawa, A. Ishitani, D.A. Dixon, and T. Uda, "Theoretical calculations of photoabsorption of several alicyclic molecules in the vacuum ultraviolet region", Proc. SPIE Vol. 4345, 396 (2001).
    • (2001) Proc. SPIE , vol.4345 , pp. 396
    • Matsuzawa, N.1    Ishitani, A.2    Dixon, D.A.3    Uda, T.4
  • 14
    • 0020497931 scopus 로고
    • Dry etch resistance of organic materials
    • H. Gokan, S. Esho and Y. Ohnishi, "Dry etch resistance of organic materials", J. Electrochem. Soc., 130, 143 (1983).
    • (1983) J. Electrochem. Soc. , vol.130 , pp. 143
    • Gokan, H.1    Esho, S.2    Ohnishi, Y.3
  • 16
    • 0000765436 scopus 로고    scopus 로고
    • Study of dry etching resistance of methacrylate polymers for ArF excimer laser lithography
    • T. Ohfuji, M. Endo, M. Takahashi, T. Naito, T. Tatsumi, K. Kuhara and M. Sasago, "Study of dry etching resistance of methacrylate polymers for ArF excimer laser lithography", Proc. SPIE Vol. 3333, 595 (1998).
    • (1998) Proc. SPIE , vol.3333 , pp. 595
    • Ohfuji, T.1    Endo, M.2    Takahashi, M.3    Naito, T.4    Tatsumi, T.5    Kuhara, K.6    Sasago, M.7
  • 17
    • 0005023527 scopus 로고    scopus 로고
    • Dry etch resistance of resist based on fluorine containing polymer
    • S. Kishimura, M. Endo and M. Sasago, "Dry etch resistance of resist based on fluorine containing polymer", Proc. Oyobutsuri Kouenkai Vol. 48, 737 (2001).
    • (2001) Proc. Oyobutsuri Kouenkai , vol.48 , pp. 737
    • Kishimura, S.1    Endo, M.2    Sasago, M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.