Depth-dependent detrapping dynamics of electrons in SiO2

Journal of the Korean Physical Society

Volumn 40, Issue 3, 2002, Pages 472-475

  Kang, C J ^a   Lee, S ^b   Kuk, Y ^b  

^a Myong Ji University   (South Korea)

^b Seoul National University   (South Korea)

Author keywords

Detrapping dynamics; SCM

Indexed keywords

EID: 0036004514     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (20)

1. M. Bourcerie, B.S. Doyle, J.C. Marchetaux, J.C. Soret and A. Boudou, IEEE Trans. Electron Dev. 37, 708 (1990).
2. R.S. Scott and D.J. Dumin, IEEE Trans. Electron Dev. 43, 130 (1996).
3. Z.J. Ma, P.T. Lai and Y.C. Cheng, IEEE Trans. Electron Dev. 40, 125 (1993).
4. Chi-Jung Kang, C.K. Kim, S.J. Kahng, Y. Khang, S.J. Lee, Young Kuk and K.M. Mang, J. Korean Phys. Soc. 31, S88 (1997).
5. C.C. Williams, J. Slinkman, W.P. Hough and H.K. Wickramasinghe, Appl. Phys. Lett. 55, 1662 (1989).
6. Y. Huang and C.C. Williams, J. Vac. Sci. Technol. B 12, 369 (1994).
7. Y. Huang, C.C. Williams and M.A. Wendman, J. Vac. Sci. Technol. A 14, 1168 (1996).
8. C.J. Kang, C.K. Kim, J.D. Lera, Y. Kuk, K.M. Mang, J.G. Lee, K.S. Suh and C.C. Williams, Appl. Phys. Lett. 71, 1546 (1997).
9. R.C. Barret and C.F. Quate, J. Appl. Phys. 70, 2725 (1991).
10. U.H. Pi, J.I. Kye, S. Shin, Z.G. Khim, J.W. Hong and S. Yoon, J. Korean Phys. Soc. 39, 209 (2001).
11. C. Schnenberg and S.F. Alvarado, Phys. Rev. Lett. 65, 3162 (1990).
12. R. Ludeke, A. Bauer and E. Cartier, Appl. Phys. Lett. 66, 730 (1995).
13. B. Kaczer, Z. Meng and J.P. Pelz, Phys. Rev. Lett. 77, 91 (1996).
14. R.C. Palmer, E.J. Denlinger and H. Kawamoto, RCA Rev. 43, 194 (1982).
15. C.C. Williams, W.P. Hough and S.A. Rishton, Appl. Phys. Lett. 55, 203 (1989).
16. E.H. Nicollian and J.R. Brews, MOS Physics and Technology (Wiley, New York, 1982), Chap. 4.
17. S. Manzini and A. Modelli in Insulating Films on Seraiconductors, editted by J.F. Verweij and D.R. Wolters (North-Holland, Amsterdam, 1983), p. 112.
18. R. Wiesendanger, Scanning Probe Microscopy and Spectroscopy (Cambridge Univ. Press, Cambridge, 1994).
19. Mueng-Ryul Lee and Oh-Kyong Kwon, J. Korean Phys. Soc. 37, 897 (2000).
20. C.J. Kang, G.H. Buh, S. Lee, C.K. Kim, K.M. Mang, C. Im and Y. Kuk, Appl. Phys. Lett. 74, 1815 (1999).