Characterization of hot-carrier degradation in EDMOSFETs with metal field plates

Journal of the Korean Physical Society

Volumn 37, Issue 6, 2000, Pages 897-901

  Lee, Mueng Ryul ^a   Kwon, Oh Kyong ^a  

^a Hanyang University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0034347659     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: 10.3938/jkps.37.897     Document Type: Article

References (12)

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