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Volumn 47, Issue 15, 1999, Pages 4115-4123

Nanoindentation-induced defect-interface interactions: Phenomena, methods and limitations

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; COPPER; DELAMINATION; DISLOCATIONS (CRYSTALS); FRACTURE TOUGHNESS; MECHANICAL TESTING; METALLIC FILMS; SILICA; SILICON; STRESS ANALYSIS; STRESS CONCENTRATION; THIN FILMS;

EID: 0033329805     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(99)00270-0     Document Type: Article
Times cited : (85)

References (37)
  • 4
    • 85040875608 scopus 로고
    • Cambridge: Cambridge University Press
    • Johnson K.L. Contact Mechanics. 1985;153-179 Cambridge University Press, Cambridge.
    • (1985) Contact Mechanics , pp. 153-179
    • Johnson, K.L.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.