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Volumn 47, Issue 15, 1999, Pages 4115-4123
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Nanoindentation-induced defect-interface interactions: Phenomena, methods and limitations
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ADHESION;
COPPER;
DELAMINATION;
DISLOCATIONS (CRYSTALS);
FRACTURE TOUGHNESS;
MECHANICAL TESTING;
METALLIC FILMS;
SILICA;
SILICON;
STRESS ANALYSIS;
STRESS CONCENTRATION;
THIN FILMS;
DISLOCATION NUCLEATION;
NNOUINDENDATION TECHNIQUE;
INTERFACES (MATERIALS);
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EID: 0033329805
PISSN: 13596454
EISSN: None
Source Type: Journal
DOI: 10.1016/S1359-6454(99)00270-0 Document Type: Article |
Times cited : (85)
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References (37)
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