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Volumn 78, Issue 17, 2001, Pages 2431-2433
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Optimization of elastomeric phase masks for near-field photolithography
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0035938332
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1367898 Document Type: Article |
Times cited : (27)
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References (14)
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