Time domain impedance spectroscopy for probing the termination of silicon (100) surfaces in aqueous KOH

Journal of Physical Chemistry B

Volumn 105, Issue 50, 2001, Pages 12508-12515

  Raisch, Philipp ^a   Haiss, Wolfgang ^a   Nichols, Richard J ^a   Schiffrin, David J ^a  

^a UNIVERSITY OF LIVERPOOL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

TIME DOMAIN IMPEDANCE SPECTROSCOPY (TDIS);

CAPACITANCE MEASUREMENT; ELECTRIC IMPEDANCE; ELECTRIC POTENTIAL; ELECTRIC SPACE CHARGE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; POTASSIUM COMPOUNDS; SOLUTIONS; TIME DOMAIN ANALYSIS;

SURFACE PHENOMENA;

EID: 0035924831     PISSN: 10895647     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp011754i     Document Type: Article

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