In-situ atomic force microscopy of silicon(100) in aqueous potassium hydroxide

Electrochimica Acta

Volumn 45, Issue 28, 2000, Pages 4635-4643

  Raisch, P ^a   Haiss, W ^a   Nichols, R J ^a   Schiffrin, D J ^a  

^a UNIVERSITY OF LIVERPOOL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; ETCHING; POTASSIUM COMPOUNDS; SEMICONDUCTOR GROWTH; SINGLE CRYSTALS;

POTASSIUM HYDROXIDE;

SEMICONDUCTING SILICON;

EID: 0034292199     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0013-4686(00)00615-0     Document Type: Article

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