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Volumn 159, Issue 1, 1997, Pages 25-37
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Hydrogen-modification of electronic surface, bulk, and interface properties of silicon
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Author keywords
[No Author keywords available]
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Indexed keywords
ADSORPTION;
ELECTRONIC STRUCTURE;
ETCHING;
FERMI LEVEL;
HYDROGEN;
IMPURITIES;
INTERFACES (MATERIALS);
PASSIVATION;
SEMICONDUCTOR DOPING;
SURFACE PROPERTIES;
ATOMIC HYDROGEN;
CAPACITANCE VOLTAGE CHARACTERISTICS;
SEMICONDUCTING SILICON;
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EID: 42849084122
PISSN: 00318965
EISSN: None
Source Type: Journal
DOI: 10.1002/1521-396X(199701)159:1<25::AID-PSSA25>3.0.CO;2-C Document Type: Article |
Times cited : (11)
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References (32)
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