Intrinsic stress, island coalescence, and surface roughness during the growth of polycrystalline films

Journal of Applied Physics

Volumn 90, Issue 10, 2001, Pages 5097-5103

  Sheldon, Brian W ^a   Lau, K H A ^a   Rajamani, Ashok ^a  

^a Brown University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035890387     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1412577     Document Type: Article

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