Microstructure and properties of sol-gel processed Pb1-x Lax(Zr0.52, Ti0.48)1-x/4 O3 thin films. The effects of lanthanum content and bottom electrodes

Thin Solid Films

Volumn 389, Issue 1-2, 2001, Pages 99-107

  Es Souni, M ^a   Abed, M ^a   Piorra, A ^a   Malinowski, S ^a   Zaporojtchenko, V ^b  

^a UNIVERSITY OF APPLIED SCIENCES   (Germany)

^b UNIVERSITY OF KIEL   (Germany)

Author keywords

Dielectric properties; Scanning electron microscopy; Solution deposition; X ray diffraction

Indexed keywords

CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; DEPOSITION; DOPING (ADDITIVES); ELECTROCHEMICAL ELECTRODES; LANTHANUM; LEAD COMPOUNDS; PERMITTIVITY; SCANNING ELECTRON MICROSCOPY; SOL-GELS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

HETEROLAYERS;

DIELECTRIC FILMS;

EID: 0035876538     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(01)00871-9     Document Type: Article

References (22)