Electrical characterization of SiC/Si heterostructures with Ge-modified interfaces

Applied Surface Science

Volumn 184, Issue 1-4, 2001, Pages 79-83

  Pezoldt, J ^a   Forster Ch ^a   Weih, P ^a   Masri, P ^b  

^a ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

^b UNIV MONTPELLIER   (France)

Author keywords

Electrical characterization; Heteroepitaxy; Heterojunction; Si; SiC

Indexed keywords

CHEMICAL VAPOR DEPOSITION; MOLECULAR BEAM EPITAXY; SEMICONDUCTING GERMANIUM; SEMICONDUCTING SILICON COMPOUNDS;

RECOMBINATION CURRENTS;

HETEROJUNCTIONS;

EID: 0035852211     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00480-9     Document Type: Article

References (26)