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Volumn 78, Issue 23, 2001, Pages 3601-3603

Initial stages of SiC oxidation investigated by ion scattering and angle-resolved x-ray photoelectron spectroscopies

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0035806113     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1374518     Document Type: Article
Times cited : (76)

References (17)
  • 13
    • 0038792968 scopus 로고
    • edited by J. M. Walls Cambridge University Press, Cambridge
    • D. G. Armour, in Methods of Surface Analysis, edited by J. M. Walls (Cambridge University Press, Cambridge, 1989), pp. 263-298.
    • (1989) Methods of Surface Analysis , pp. 263-298
    • Armour, D.G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.