Single-event effects in analog and mixed-signal integrated circuits

IEEE Transactions on Nuclear Science

Volumn 43, Issue 2 PART 1, 1996, Pages 594-602

  Turflinger, Thomas L ^a  

^a NAVAL SURFACE WARFARE CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); ANALOG TO DIGITAL CONVERSION; CONTROL SYSTEMS; INTEGRATED CIRCUIT TESTING; LINEAR INTEGRATED CIRCUITS; LINEAR NETWORK ANALYSIS; MATHEMATICAL MODELS; TRANSFER FUNCTIONS; TRANSIENTS;

ANALOG CIRCUITS; MIXED SIGNAL INTEGRATED CIRCUITS; SINGLE EVENT EFFECTS;

RADIATION EFFECTS;

EID: 0030126291     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.490903     Document Type: Article

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