Heavy ion and proton induced single event transients in comparators

IEEE Transactions on Nuclear Science

Volumn 43, Issue 6 PART 1, 1996, Pages 2960-2967

  Nichols, Donald K ^a   Coss, James R ^a   Miyahira, Tetsuo F ^a   Schwartz, Harvey R ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY TRANSFER; ION BOMBARDMENT; PROTONS; RADIATION EFFECTS; TRANSIENTS;

LINEAR ENERGY TRANSFER (LET); SINGLE EVENT TRANSIENTS (SET);

COMPARATOR CIRCUITS;

EID: 0030349624     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.556892     Document Type: Article

References (2)

1. R. Koga, S. D. Pinkerton, S. C. Moss, D. C. Mayer, S. LaLumondiere, S. J. Hansel, K. B. Crawford & W. R. Grain, "Observation of SEUs in Analog Microcircuits," IEEE Trans, on Nue. Sei. NS-40. No. 6,1838 (Dec. , 1993)
2. R. Ecoffet, S. Duzellier, P. Tastet, C. Aicardi, M. LaBrunee, "Observation of Heavy Ion Induced Transients in Linear Circuits," 1994 IEEE Radiation Effects Data Workshop, p. 72 (Dec. , 1994)