Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions

IEEE Transactions on Nuclear Science

Volumn 44, Issue 6 PART 1, 1997, Pages 2325-2332

  Koga, R ^a   Penzin, S U ^b   Crawford, K B ^b   Grain, W R ^b   Moss, S C ^b   Pinkerton, S D ^b   Lalumondiere, S D ^b   Maher M C ^b  

^a AEROSPACE CORPORATION   (United States)

^b NATIONAL SEMICONDUCTOR CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTEGRATED CIRCUIT TESTING; MICROELECTRONICS; RADIATION EFFECTS; SEMICONDUCTOR DEVICE MODELS; SENSITIVITY ANALYSIS;

SINGLE EVENT UPSET (SEU);

LINEAR INTEGRATED CIRCUITS;

EID: 0031375382     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.659055     Document Type: Article

References (9)

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