Effective techniques for high-level ATPG

Proceedings of the Asian Test Symposium

Volumn , Issue , 2001, Pages 225-230

  Corno, Fulvio ^a   Cumani, Gianluca ^a   Reorda, Matteo Sonza ^a   Squillero, Giovanni ^a  

^a POLITECNICO DI TORINO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION SPECIFIC INTEGRATED CIRCUITS; COMPUTER HARDWARE DESCRIPTION LANGUAGES; COMPUTER SIMULATION; GENETIC ALGORITHMS; INTEGRATED CIRCUIT LAYOUT; ITERATIVE METHODS;

HIGH-LEVEL AUTOMATIC TEST PATTERN GENERATION; OBSERVABILITY-ENHANCED STATEMENT COVERAGE;

INTEGRATED CIRCUIT TESTING;

EID: 0035699320     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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