Interface-modified YBCO ramp-edge Josephson junctions by deionized water

Superconductor Science and Technology

Volumn 14, Issue 12, 2001, Pages 1056-1059

  Kye, J I ^a   Choi, H S ^a   Ahn, J H ^a   Yun, J H ^a   Moon, S H ^a   Oh, B D ^a  

^a LG Electronics Inc   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CURRENT VOLTAGE CHARACTERISTICS; HIGH TEMPERATURE SUPERCONDUCTORS; INTERFACES (MATERIALS); MAGNETIC FIELD EFFECTS; MAGNETIC FLUX; PHOTOLITHOGRAPHY; PULSED LASER DEPOSITION; SUPERCONDUCTING FILMS; WATER; YTTRIUM BARIUM COPPER OXIDES;

RAMP-EDGE INTERFACES;

JOSEPHSON JUNCTION DEVICES;

EID: 0035668133     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/14/12/316     Document Type: Article

References (20)