Investigations of silicon nano-crystal floating gate memories

Materials Research Society Symposium - Proceedings

Volumn 638, Issue , 2001, Pages

  Kumar, Arvind ^a   Welser, Jeffrey J ^a   Tiwari, Sandip ^a   Rana, Farhan ^a   Chan, Kevin K ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; ELECTRON TRAPS; FLASH MEMORY; INTERFACES (MATERIALS); MOS DEVICES; NANOSTRUCTURED MATERIALS; SEMICONDUCTING SILICON; SEMICONDUCTOR STORAGE; THRESHOLD VOLTAGE; TRANSMISSION ELECTRON MICROSCOPY; ULTRAHIGH VACUUM;

FLOATING GATE MEMORIES;

GATES (TRANSISTOR);

EID: 0035559282     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)