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Volumn 228, Issue 2, 2001, Pages 441-444
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Electronic defect states observed by cathodoluminescence spectroscopy at GaN/sapphire interfaces
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0035539986
PISSN: 03701972
EISSN: None
Source Type: Journal
DOI: 10.1002/1521-3951(200111)228:2<441::AID-PSSB441>3.0.CO;2-Y Document Type: Article |
Times cited : (6)
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References (12)
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