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Volumn 228, Issue 2, 2001, Pages 441-444

Electronic defect states observed by cathodoluminescence spectroscopy at GaN/sapphire interfaces

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Indexed keywords


EID: 0035539986     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-3951(200111)228:2<441::AID-PSSB441>3.0.CO;2-Y     Document Type: Article
Times cited : (6)

References (12)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.