Measurement and characterization of HEMT dynamics

IEEE Transactions on Microwave Theory and Techniques

Volumn 49, Issue 11, 2001, Pages 2105-2111

  Parker, A E ^a   Rathmell, J G ^a  

^a MACQUARIE UNIVERSITY   (Australia)

Author keywords

HEMTs; High speed devices; Impact ionization; Kink effect; Pulsed characterization

Indexed keywords

DISPERSION EFFECTS; DRAIN CURRENT MODEL; PULSE MEASUREMENT; TRAPPING EFFECTS;

COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; DISPERSION (WAVES); DYNAMICS; ELECTRON TRAPS; IMPACT IONIZATION; SPATIAL VARIABLES MEASUREMENT; THERMODYNAMICS;

HIGH ELECTRON MOBILITY TRANSISTORS;

EID: 0035507119     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.963144     Document Type: Article

References (13)

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