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Volumn 233, Issue 1-2, 2001, Pages 211-218

Incorporation of boron and vanadium during PVT growth of 6H-SiC crystals

Author keywords

A1. doping; A1. impurities; A1. segregation; A2. growth from vapor; B1. silicon carbide

Indexed keywords

BORON; CARRIER CONCENTRATION; CHARGE CARRIERS; CRYSTAL IMPURITIES; LIGHT ABSORPTION; NITROGEN; PARAMAGNETIC RESONANCE; PRECIPITATION (CHEMICAL); SEMICONDUCTOR DOPING; SILICON CARBIDE; SILICON WAFERS; VANADIUM;

EID: 0035502051     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(01)01579-2     Document Type: Article
Times cited : (48)

References (18)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.