Onset of slip in silicon containing oxide precipitates

Journal of Applied Physics

Volumn 90, Issue 7, 2001, Pages 3219-3225

  Jurkschat, K ^a   Senkader, S ^a   Wilshaw, P R ^a   Gambaro, D ^b   Falster, R J ^b  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b MEMC Electronic Materials SpA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035476377     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1398596     Document Type: Article

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