Offset in CMOS magnetotransistors - Part I: Analysis of causes

IEEE Transactions on Electron Devices

Volumn 48, Issue 9, 2001, Pages 1945-1953

  Metz, Matthias ^b   Baltes, Henry ^a,b  

^a IEEE

^b ETH ZURICH   (Switzerland)

Author keywords

Magnetic transducers; Magnetotransistor; Offset analysis; Semiconductor device matching; Semiconductor fabrication imperfections

Indexed keywords

ELECTRIC CURRENTS; MASKS; PHOTOLITHOGRAPHY; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE STRUCTURES;

MAGNETIC TRANSDUCERS; MAGNETOTRANSISTORS; SEMICONDUCTOR DEVICE MATCHING;

CMOS INTEGRATED CIRCUITS;

EID: 0035444713     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.944181     Document Type: Article

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