Temperature Calibration of CMOS Magnetic Vector Probe for Contactless Angle Measurement System

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 1996, Pages 533-536

  Schneider, M ^a   Haberli A ^a   Metz, M ^a   Malcovati, P ^b   Baltes, H ^a  

^a ETH ZURICH   (Switzerland)

^b UNIVERSITY OF PAVIA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE MEASUREMENT; CMOS INTEGRATED CIRCUITS; PERMANENT MAGNETS; TEMPERATURE DISTRIBUTION; CALIBRATION; MAGNETIC DEVICES; PROBES; TEMPERATURE;

CONTACT LESS; MAGNETIC VECTORS; MAGNETOTRANSISTORS; MEASUREMENT SYSTEM; SINGLE-CHIP; TEMPERATURE CALIBRATION; TEMPERATURE DEPENDENCE; TIME STABILITY; TWO-DIMENSIONAL;

PROBES; CMOS INTEGRATED CIRCUITS;

MAGNETIC SENSOR; MAGNETOTRANSISTOR VECTOR PROBE;

EID: 0030387335     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.1996.554037     Document Type: Conference Paper

References (10)

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