Analysis and reduction of CMOS magnetotransistor offset

European Solid-State Device Research Conference

Volumn , Issue , 1998, Pages 184-187

  Metz, M ^a   Schneider, M ^a   Haberli, A ^a   Baltes, H ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE DETECTION; COLLECTOR CURRENTS; MAGNETOTRANSISTORS; METAL CONTACTS; NOVEL STRUCTURES; REDUCED OFFSETS; SPATIAL OFFSETS; STANDARD DEVIATION;

STATISTICS;

EID: 84908181144     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)

1. M. Schneider, A. Haberli, M. Metz, P. Malcovati, and H. Baltes, "Temperature Calibration of CMOS Magnetic Vector Probe for Contactless Angle Measurement System," IEDM 96 Tech. Digest, (1996), pp. 533-536.
2. Ashburn, H., Design and Realization of Bipolar Transistors, John Wiley & Sons, Chichester, UK, (1988), pp. 48ff.
3. F. Meli, and R. Thalmann, "Long-Range AFM Profiler Used for Accurate Pitch Measurements," Meas. Sci. Technol. 9 (1998) in press.