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Volumn 505, Issue , 1998, Pages 319-324
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Thermal cycling fatigue in aluminum-alloy thin films on silicon substrate
a
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM ALLOYS;
CRYSTAL LATTICES;
DELAMINATION;
DISLOCATIONS (CRYSTALS);
FATIGUE OF MATERIALS;
GRAIN BOUNDARIES;
RESIDUAL STRESSES;
SILICON WAFERS;
THERMAL CYCLING;
THIN FILMS;
RESIDUAL STRESS MEASUREMENT;
METALLIC FILMS;
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EID: 0031645083
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (1)
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References (23)
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